XP Power Ltd.
XP Power Ltd.
| Address(es) |
|
| Website | Not available |
| Status | WITHDRAWN |
| Acceptance date | 2020-09-23 |
Further information
Stage | Country | Name |
|---|---|---|
3 | United States of America | |
2 | United States of America |
LEGEND: Scope Limitations
- RA : Audio amplifiers with audio power > 0,5 Watts excluded
- RC : Apparatus with connection(s) to a cable distribution system excluded
- RSH : Shredders excluded
- RT : Apparatus with connection(s) to a telecommunication network excluded
- RV : CRT (cathode ray tubes)/ picture tubes, plasma/LCD or other video apparatus excluded
- ROUT : Equipment intended for installation outdoors excluded
- RWPT : Wireless power transmitter excluded
Category | Name | Tests/Clauses | Acceptance Date | Responsible National Certification Body |
|---|---|---|---|---|
ITAV | IEC 62368-1:2014 | 4.4.4.2, Annex T.5 - Steady Force Test 250n 14.4.4.2, Annex T.3 - Steady Force Test 30n 14.4.4.4, Annex T.6 - Impact Test 14.4.4.7, Annex T.8 - Stress Relief Test 15.2, 5.7 - Classification Of Electrical Energy Sources 15.4.1.4, Annex B.2 - Maximum Operating Temperature For Materials, Components And System 15.4.1.8 - Determination Of Working Voltage 15.4.1.10.3 - Ball Pressure Test 15.4.4.6.2 - Separable Thin Sheet Material 15.4.8 - Humidity Conditioning 15.4.9 - Electric Strength Test 15.5.2.2 - Safeguards Against Capacitor Discharge After Disconnection Of A Capacitor 15.6.6.2 (A) - RESISTANCE OF THE PROTECTIVE BONDING SYSTEM 15.7 - Prospective Touch Voltage And Touch Current Measurement 15.7.5 - Protective Conductor Current 16.2.2.2, 6.2.2.3 - Power Measurements 1Annex B.2.5 - Input Test: Single Phase 1Annex B.3 - Simulated Abnormal Operating Conditions 1Annex B.4 - Simulated Single Fault Conditions 1Annex F.3.10 - Test For The Permanence Of Markings 1Annex G.5.3.3 - Transformer Overload 1Annex G.5.3.3.3 - Transformer Overload – Alternative Test Method 1Annex G.7.3.2 - Strain Relief Test 1Annex Q.1 - Limited Power Source 1Annex T.2 - Steady Force Test, 10 N 1 | 2021-10-25 | |
MED | IEC 60601-1:2005 | 4.11 - Power Input8.4.3 - Voltage or Charge Limitation8.7 - Leakage Current Tests8.7.4.5 - Earth Leakage Current8.7.4.6 - Touch Leakage Current8.7.3 e) - Non-Frequency-Weighted Leakage Current8.8.3 - Dielectric Voltage Withstand11 - Temperature13.2 – Single Fault Conditions13.2.7 – Impairment of Cooling4.11 - Power Input8.4.3 - Voltage or Charge Limitation8.7 - Leakage Current Tests8.7.4.5 - Earth Leakage Current8.7.4.6 - Touch Leakage Current8.7.3 e) - Non-Frequency-Weighted Leakage Current8.8.3 - Dielectric Voltage Withstand11 - Temperature13.2 – Single Fault Conditions13.2.7 – Impairment of Cooling | 2020-09-23 | |
MED | IEC 60601-1:2005/AMD1:2012 | 4.11 - Power Input8.4.3 - Voltage or Charge Limitation8.7 - Leakage Current Tests8.7.4.5 - Earth Leakage Current8.7.4.6 - Touch Leakage Current8.7.3 e) - Non-Frequency-Weighted Leakage Current8.8.3 - Dielectric Voltage Withstand11 - Temperature13.2 – Single Fault Conditions13.2.7 – Impairment of Cooling4.11 - Power Input8.4.3 - Voltage or Charge Limitation8.7 - Leakage Current Tests8.7.4.5 - Earth Leakage Current8.7.4.6 - Touch Leakage Current8.7.3 e) - Non-Frequency-Weighted Leakage Current8.8.3 - Dielectric Voltage Withstand11 - Temperature13.2 – Single Fault Conditions13.2.7 – Impairment of Cooling | 2020-09-23 | |
OFF | IEC 60950-1:2005 | 1.2.2.1 - Guide Information Page – Maximum Output Voltage, Current, and Volt-Ampere Measurement Test1.6.2 - Input Test: Single-Phase1.7.11 - Durability Of Marking Test2.1.1.5, 2.1.2, 1.2.8.10 - Energy Hazard Measurements2.1.1.7 - Capacitance Discharge Test2.2.2, 2.2.3, 2.2.4, Part 22 6.1 - Selv Reliability Test Including Hazardous Voltage Measurements2.4.1, 2.4.2 - Limited Current Circuit Measurements2.5 - Limited Power Source Measurements2.6.3.4, 2.6.1 - Protective Bonding Test I2.6.3.4, 2.6.1 - Protective Bonding Test Ii2.9.1, 2.9.2, 5.2.2 - Humidity Test2.10.2 - Determination Of Working Voltage - Working Voltage Measurement Test2.10.5.9, 2.10.5.10, 2.10.5.6 - Thin Sheet Material Tests2.10.5.6, 2.10.5.13 - Transformer And Wire Insulation Electric Strength Test4.2.1, 4.2.4 - Steady Force Tests4.2.5, 4.2.1, Part 22.10.2 - Impact Test4.2.6, 4.2.1 - Drop Test4.2.7, 4.2.1 - Stress Relief Test4.4.2, 4.4.4 - Hazardous Moving Parts Test4.5.1, 1.4.12, 1.4.13 - Heating Test4.5.5, 4.5 - Ball Pressure Test5.1, Annex D - Touch Current Test (Single-Phase; Tn/Tt System)5.2.2 - Electric Strength Test5.3.1 – 5.3.9 - Abnormal Operation Tests5.3.1, 5.3.4, 5.3.7 - Component Failure Test5.3.3, 5.3.7b, ANNEX C.1 - TRANSFORMER ABNORMAL OPERATION TEST5.3.7 - Overload Of Operator Accessible Connector Test5.3.7 - Power Supply Output Short-Circuit/Overload Test | 2021-10-25 | |
OFF | IEC 60950-1:2005/AMD2:2013 | 1.2.2.1 - Guide Information Page – Maximum Output Voltage, Current, and Volt-Ampere Measurement Test1.6.2 - Input Test: Single-Phase1.7.11 - Durability Of Marking Test2.1.1.5, 2.1.2, 1.2.8.10 - Energy Hazard Measurements2.1.1.7 - Capacitance Discharge Test2.2.2, 2.2.3, 2.2.4, Part 22 6.1 - Selv Reliability Test Including Hazardous Voltage Measurements2.4.1, 2.4.2 - Limited Current Circuit Measurements2.5 - Limited Power Source Measurements2.6.3.4, 2.6.1 - Protective Bonding Test I2.6.3.4, 2.6.1 - Protective Bonding Test Ii2.9.1, 2.9.2, 5.2.2 - Humidity Test2.10.2 - Determination Of Working Voltage - Working Voltage Measurement Test2.10.5.9, 2.10.5.10, 2.10.5.6 - Thin Sheet Material Tests2.10.5.6, 2.10.5.13 - Transformer And Wire Insulation Electric Strength Test4.2.1, 4.2.4 - Steady Force Tests4.2.5, 4.2.1, Part 22.10.2 - Impact Test4.2.6, 4.2.1 - Drop Test4.2.7, 4.2.1 - Stress Relief Test4.4.2, 4.4.4 - Hazardous Moving Parts Test4.5.1, 1.4.12, 1.4.13 - Heating Test4.5.5, 4.5 - Ball Pressure Test5.1, Annex D - Touch Current Test (Single-Phase; Tn/Tt System)5.2.2 - Electric Strength Test5.3.1 – 5.3.9 - Abnormal Operation Tests5.3.1, 5.3.4, 5.3.7 - Component Failure Test5.3.3, 5.3.7b, ANNEX C.1 - TRANSFORMER ABNORMAL OPERATION TEST5.3.7 - Overload Of Operator Accessible Connector Test5.3.7 - Power Supply Output Short-Circuit/Overload Test | 2021-10-25 |