Transistor Devices, Inc.
Transistor Devices, Inc.
| Address(es) |
|
| Website | Not available |
| Status | MEMBER |
| Acceptance date | 2015-03-15 |
Further information
Stage | Country | Name |
|---|---|---|
3 | United States of America |
LEGEND: Scope Limitations
- RA : Audio amplifiers with audio power > 0,5 Watts excluded
- RC : Apparatus with connection(s) to a cable distribution system excluded
- RSH : Shredders excluded
- RT : Apparatus with connection(s) to a telecommunication network excluded
- RV : CRT (cathode ray tubes)/ picture tubes, plasma/LCD or other video apparatus excluded
- ROUT : Equipment intended for installation outdoors excluded
- RWPT : Wireless power transmitter excluded
Category | Name | Tests/Clauses | Acceptance Date | Responsible National Certification Body |
|---|---|---|---|---|
ITAV | IEC 62368-1:2014 | 5.4.1.4, ANNEX B.2 MAXIMUM OPERATING TEMPERATURE FOR MATERIALS, COMPONENTS AND SYSTEMS5.4.9 ELECTRIC STRENGTH5.6.6.2(A) RESISTANCE OF THE PROTECTIVE BONDING SYSTEMB.2.5 INPUT TEST9.2.5 TOUCH TEMPERATURE TEST: NORMAL OPERATING CONDITIONS5.6.6.2 B) RESISTANCE OF THE PROTECTIVE BONDING SYSTEM: EXCEEDING 25 AAnnex B.3, B.3.1 SIMULATED ABNORMAL OPERATING CONDITIONS - GENERAL | 2017-03-28 | |
MEAS | IEC 61010-1:2010 | 110.1-10.4 NORMAL TEMPERATURE TEST13.2.2 BATTERY ABNORMAL4.4 SINGLE FAULT CONDITION4.4.2.7.2 MAINS TRANSFORMER SHORT CIRCUIT4.4.2.7.3 MAINS TRANSFORMER OVERLOAD4.4.2.8 OUTPUT ABNORMAL5.1.3 INPUT POWER/CURRENT MEASUREMENT6.10.3 CAPACITOR DISCHARGE6.5.2.4 AND 6.5.2.5 GROUNDING CONTINUITY TEST6.8 DIELECTRIC STRENGTH | 2015-03-15 | |
OFF | IEC 60950-1:2005 | 1.2.2.1 MAXIMUM OUTPUT VOLTAGE, CURRENT, AND VOLT AMPERE MEASUREMENT TEST1.6.2 INPUT TEST: SINGLE-PHASE1.6.2 INPUT TEST: POLYPHASE2.1.1.7 CAPACITANCE DISCHARGE TEST2.10.2 DETERMINATION OF WORKING VOLTAGE - WORKING VOLTAGE MEASUREMENT TEST2.2 SELV CIRCUITS2.4.1, 2.4.2 LIMITED CURRENT CIRCUIT MEASUREMENTS2.6.3.4, 2.6.1 PROTECTIVE BONDING TEST I2.6.3.4, 2.6.1 PROTECTIVE BONDING TEST II4.3.8 BATTERY TESTS4.5.1, 1.4.12, 1.4.13 HEATING TEST5.1, ANNEX D TOUCH CURRENT TEST (POLYPHASE; TN/TT SYSTEM)5.1, ANNEX D TOUCH CURRENT TEST (SINGLE-PHASE; TN/TT SYSTEM)5.2.2 ELECTRIC STRENGTH TEST5.3.1, 5.3.4, 5.3.7 COMPONENT FAILURE TEST5.3.1, 5.3.9 ABNORMAL OPERATION TESTS5.3.3, 5.3.7B, ANNEX C.1 TRANSFORMER ABNORMAL OPERATION TEST5.3.7 POWER SUPPLY OUTPUT SHORT-CIRCUIT/OVERLOAD TEST | 2015-03-15 | |
OFF | IEC 60950-1:2005/AMD1:2009 | 1.2.2.1 MAXIMUM OUTPUT VOLTAGE, CURRENT, AND VOLT AMPERE MEASUREMENT TEST1.6.2 INPUT TEST: SINGLE-PHASE1.6.2 INPUT TEST: POLYPHASE2.1.1.7 CAPACITANCE DISCHARGE TEST2.10.2 DETERMINATION OF WORKING VOLTAGE - WORKING VOLTAGE MEASUREMENT TEST2.2 SELV CIRCUITS2.4.1, 2.4.2 LIMITED CURRENT CIRCUIT MEASUREMENTS2.6.3.4, 2.6.1 PROTECTIVE BONDING TEST I2.6.3.4, 2.6.1 PROTECTIVE BONDING TEST II4.3.8 BATTERY TESTS4.5.1, 1.4.12, 1.4.13 HEATING TEST5.1, ANNEX D TOUCH CURRENT TEST (POLYPHASE; TN/TT SYSTEM)5.1, ANNEX D TOUCH CURRENT TEST (SINGLE-PHASE; TN/TT SYSTEM)5.2.2 ELECTRIC STRENGTH TEST5.3.1, 5.3.4, 5.3.7 COMPONENT FAILURE TEST5.3.1, 5.3.9 ABNORMAL OPERATION TESTS5.3.3, 5.3.7B, ANNEX C.1 TRANSFORMER ABNORMAL OPERATION TEST5.3.7 POWER SUPPLY OUTPUT SHORT-CIRCUIT/OVERLOAD TEST | 2015-03-15 | |
OFF | IEC 60950-1:2005/AMD2:2013 | 1.2.2.1 MAXIMUM OUTPUT VOLTAGE, CURRENT, AND VOLT AMPERE MEASUREMENT TEST1.6.2 INPUT TEST: SINGLE-PHASE1.6.2 INPUT TEST: POLYPHASE2.1.1.7 CAPACITANCE DISCHARGE TEST2.10.2 DETERMINATION OF WORKING VOLTAGE - WORKING VOLTAGE MEASUREMENT TEST2.2 SELV CIRCUITS2.4.1, 2.4.2 LIMITED CURRENT CIRCUIT MEASUREMENTS2.6.3.4, 2.6.1 PROTECTIVE BONDING TEST I2.6.3.4, 2.6.1 PROTECTIVE BONDING TEST II4.3.8 BATTERY TESTS4.5.1, 1.4.12, 1.4.13 HEATING TEST5.1, ANNEX D TOUCH CURRENT TEST (POLYPHASE; TN/TT SYSTEM)5.1, ANNEX D TOUCH CURRENT TEST (SINGLE-PHASE; TN/TT SYSTEM)5.2.2 ELECTRIC STRENGTH TEST5.3.1, 5.3.4, 5.3.7 COMPONENT FAILURE TEST5.3.1, 5.3.9 ABNORMAL OPERATION TESTS5.3.3, 5.3.7B, ANNEX C.1 TRANSFORMER ABNORMAL OPERATION TEST5.3.7 POWER SUPPLY OUTPUT SHORT-CIRCUIT/OVERLOAD TEST | 2015-03-15 |