Salzer Electronics Limited
Salzer Electronics Limited
| Address(es) |
|
| Website | Not available |
| Status | MEMBER |
| Acceptance date | 2020-10-24 |
Further information
Stage | Country | Name |
|---|---|---|
2 | Denmark | |
2 | Denmark |
LEGEND: Scope Limitations
- RA : Audio amplifiers with audio power > 0,5 Watts excluded
- RC : Apparatus with connection(s) to a cable distribution system excluded
- RSH : Shredders excluded
- RT : Apparatus with connection(s) to a telecommunication network excluded
- RV : CRT (cathode ray tubes)/ picture tubes, plasma/LCD or other video apparatus excluded
- ROUT : Equipment intended for installation outdoors excluded
- RWPT : Wireless power transmitter excluded
Category | Name | Tests/Clauses | Acceptance Date | Responsible National Certification Body |
|---|---|---|---|---|
POW | IEC 60947-3:2020 | 9.3.4.2 Temperature-rise9.3.4.3 Di-electric properties9.3.4.4 Making and breaking capacities9.3.4.5 Di-electric verification9.3.4.6 Leakage Current9.3.4.7 Temperature-rise verification9.3.5.2 Operational performance capability9.3.5.3 Di-electric verification9.3.5.4 Leakage Current9.3.5.5 Temperature-rise verification | 2023-04-05 | |
POW | IEC 60947-3:2008 | 8.3.3.1 Temperature-rise8.3.3.2 Di-electric properties8.3.3.3 Making and breaking capacities8.3.3.4 Di-electric verification8.3.3.5 Leakage Current8.3.3.6 Temperature-rise verification8.3.4.1 Operational performance capability8.3.4.2 Di-electric verification8.3.4.3 Leakage Current8.3.4.4 Temperature-rise verification | 2020-10-24 | |
POW | IEC 60947-3:2008/AMD1:2012 | 8.3.3.1 Temperature-rise8.3.3.2 Di-electric properties8.3.3.3 Making and breaking capacities8.3.3.4 Di-electric verification8.3.3.5 Leakage Current8.3.3.6 Temperature-rise verification8.3.4.1 Operational performance capability8.3.4.2 Di-electric verification8.3.4.3 Leakage Current8.3.4.4 Temperature-rise verification | 2020-10-24 | |
POW | IEC 60947-3:2008/AMD2:2015 | 8.3.3.1 Temperature-rise8.3.3.2 Di-electric properties8.3.3.3 Making and breaking capacities8.3.3.4 Di-electric verification8.3.3.5 Leakage Current8.3.3.6 Temperature-rise verification8.3.4.1 Operational performance capability8.3.4.2 Di-electric verification8.3.4.3 Leakage Current8.3.4.4 Temperature-rise verification | 2020-10-24 | |
POW | IEC 60947-4-1:2018 | 9.3.3.3 Verification of temperature rise9.3.3.1, 9.3.3.2 Verification of operation and operating limits9.3.3.4 Verification of dielectric properties9.3.3.5 Verification of rated making and breaking capacities, change-over ability and reversibility, where applicable9.3.3.6 Verification of conventional operational performance9.3.5 verification of ability to withstand overload currents | 2022-04-07 | |
POW | IEC 60947-4-1:2009 | 9.3.3.3 Verification of temperature rise9.3.3.1, 9.3.3.2 Verification of operation and operating limits9.3.3.4 Verification of dielectric properties9.3.3.5 Verification of rated making and breaking capacities, change-over ability and reversibility, where applicable9.3.3.6 Verification of conventional operational performance9.3.5 verification of ability to withstand overload currents | 2020-10-24 | |
POW | IEC 60947-4-1:2009/AMD1:2012 | 9.3.3.3 Verification of temperature rise9.3.3.1, 9.3.3.2 Verification of operation and operating limits9.3.3.4 Verification of dielectric properties9.3.3.5 Verification of rated making and breaking capacities, change-over ability and reversibility, where applicable9.3.3.6 Verification of conventional operational performance9.3.5 verification of ability to withstand overload currents | 2023-04-05 |