TDK-Lambda Switzerland SA
TDK-Lambda Switzerland SA
Address(es) |
|
Website | Not available |
Status | MEMBER |
Acceptance date | 2020-06-30 |
Further information
Stage | Country | Name |
---|---|---|
2 | Denmark |
LEGEND: Scope Limitations
- RA : Audio amplifiers with audio power > 0,5 Watts excluded
- RC : Apparatus with connection(s) to a cable distribution system excluded
- RSH : Shredders excluded
- RT : Apparatus with connection(s) to a telecommunication network excluded
- RV : CRT (cathode ray tubes)/ picture tubes, plasma/LCD or other video apparatus excluded
- ROUT : Equipment intended for installation outdoors excluded
- RWPT : Wireless power transmitter excluded
Category | Name | Tests/Clauses | Acceptance Date | Responsible National Certification Body |
---|---|---|---|---|
ITAV | IEC 62368-1:2018 | 5.2, 5.7 – CLASSIFICATION OF ELECTRICAL ENERGY SOURCES5.4.1.3 – TEST FOR HYGROSCOPIC MATERIALS5.4.1.8 – DETERMINATION OF WORKING VOLTAGE5.4.9.1 – ELECTRIC STRENGTH TEST – TYPE TESTING OF SOLID INSULATION5.5.2.2 – SAFEGUARDS AGAINST CAPACITOR DISCHARGE AFTER DISCONNECTION OF A CONNECTOR5.6.6.2 – RESISTANCE OF TH PROTECTIVE BONDING SYSTEM5.7.4 – TOUCH CURRENT MEASUREMENT – EARTHED ACCESSIBLE CONDUCTIVE PARTS – THREE-PHASE EQUIPMENTB.2.5 - INPUT SINGLE PHASEB.2.5 – INPUT TEST: POLYPHASEB.2.6, 5.4.1.4, 6.3, 9.2 – NORMAL OPERATING CONDITIONS TEMPERATURE MEASUREMENTB.3 – SIMULATED ABNORMAL OPERATING CONDITIONSB.4 – SIMULATED SINGLE FAULT CONDITIONSF. 3.10 – TEST FOR THE PERMANENCE OF MARKINGSANNEX G.5.3.3 – TRANSFORMER OVERLOAD | 2024-02-01 | |
ITAV | IEC 62368-1:2014 | 5.2, 5.7 – CLASSIFICATION OF ELECTRICAL ENERGY SOURCES5.4.1.3 – TEST FOR HYGROSCOPIC MATERIALS5.4.1.8 – DETERMINATION OF WORKING VOLTAGE5.4.9.1 – ELECTRIC STRENGTH TEST – TYPE TESTING OF SOLID INSULATION5.5.2.2 – SAFEGUARDS AGAINST CAPACITOR DISCHARGE AFTER DISCONNECTION OF A CONNECTOR5.6.6.2 – RESISTANCE OF TH PROTECTIVE BONDING SYSTEM5.7.4 – TOUCH CURRENT MEASUREMENT – EARTHED ACCESSIBLE CONDUCTIVE PARTS – THREE-PHASE EQUIPMENTB.2.5 - INPUT SINGLE PHASEB.2.5 – INPUT TEST: POLYPHASEB.2.6, 5.4.1.4, 6.3, 9.2 – NORMAL OPERATING CONDITIONS TEMPERATURE MEASUREMENTB.3 – SIMULATED ABNORMAL OPERATING CONDITIONSB.4 – SIMULATED SINGLE FAULT CONDITIONSF. 3.10 – TEST FOR THE PERMANENCE OF MARKINGSANNEX G.5.3.3 – TRANSFORMER OVERLOAD | 2021-03-20 | |
MEAS | IEC 61010-1:2010 | SINGLE FAULT CONDITION TESTS (4.4)COMPONENT ABNORMAL (4.4.1)PROTECTIVE IMPEDANCE ABNORMAL TEST (4.4.2.2)PROTECTIVE CONDUCTOR ABNORMAL TEST (4.4.2.3)SHORT TERM / INTERMITTENT DUTY ABNORMAL TEST (4.4.2.4)CAPACITOR SHORT CIRCUIT ABNORMAL TEST (4.4.2.6)MAINS TRANSFORMER SHORT CIRCUIT TEST (4.4.2.7.2)MAINS TRANSFORMER OVERLOAD TEST (4.4.2.7.3)OUTPUT ABNORMAL TEST (4.4.2.8)MULTI-SUPPLY ABNORMAL TEST (4.4.2.9)COOLING ABNORMAL TEST (4.4.2.10)INSULATION BETWEEN CIRCUITS AND PARTS ABNORMAL TEST (4.4.2.12)SUPPLY VOLTAGE SELECTOR TEST (4.4.2.14)MAINS SUPPLY (5.1.3)DURABILITY OF MARKINGS TEST (5.3)DETERMINATION OF ACCESSIBLE PARTS (6.2)LIMIT VALUES FOR ACCESSIBLE PARTS (6.3)GROUNDING CONTINUITY TEST (6.5.2.4 AND 6.5.2.5)INSULATION REQUIREMENTS (6.7, ANNEX K)DIELECTRIC VOLTAGE WITHSTAND TEST (6.8)HUMIDITY CONDITIONING TEST (6.8.2)RIGIDITY TEST (8.2.1)LIMITED ENERGY CIRCUIT DETERMINATION TEST (9.4)TEMPERATURE TEST (10.1-10.4)(61010-2-201,2ND ED. 10.4.1.100–10.4.1.103)RESISTANCE TO HEAT OF NONMETALLIC ENCLOSURE TEST (10.5.2):INTEGRITY OF CLEARANCES AND CREEPAGES TEST (10.5.1)BATTERY ABNORMAL TEST (13.2.2) | 2020-10-23 | |
MEAS | IEC 61010-1:2010/AMD1:2016 | SINGLE FAULT CONDITION TESTS (4.4)COMPONENT ABNORMAL (4.4.1)PROTECTIVE IMPEDANCE ABNORMAL TEST (4.4.2.2)PROTECTIVE CONDUCTOR ABNORMAL TEST (4.4.2.3)SHORT TERM / INTERMITTENT DUTY ABNORMAL TEST (4.4.2.4)CAPACITOR SHORT CIRCUIT ABNORMAL TEST (4.4.2.6)MAINS TRANSFORMER SHORT CIRCUIT TEST (4.4.2.7.2)MAINS TRANSFORMER OVERLOAD TEST (4.4.2.7.3)OUTPUT ABNORMAL TEST (4.4.2.8)MULTI-SUPPLY ABNORMAL TEST (4.4.2.9)COOLING ABNORMAL TEST (4.4.2.10)INSULATION BETWEEN CIRCUITS AND PARTS ABNORMAL TEST (4.4.2.12)SUPPLY VOLTAGE SELECTOR TEST (4.4.2.14)MAINS SUPPLY (5.1.3)DURABILITY OF MARKINGS TEST (5.3)DETERMINATION OF ACCESSIBLE PARTS (6.2)LIMIT VALUES FOR ACCESSIBLE PARTS (6.3)GROUNDING CONTINUITY TEST (6.5.2.4 AND 6.5.2.5)INSULATION REQUIREMENTS (6.7, ANNEX K)DIELECTRIC VOLTAGE WITHSTAND TEST (6.8)HUMIDITY CONDITIONING TEST (6.8.2)RIGIDITY TEST (8.2.1)LIMITED ENERGY CIRCUIT DETERMINATION TEST (9.4)TEMPERATURE TEST (10.1-10.4)(61010-2-201,2ND ED. 10.4.1.100–10.4.1.103)RESISTANCE TO HEAT OF NONMETALLIC ENCLOSURE TEST (10.5.2):INTEGRITY OF CLEARANCES AND CREEPAGES TEST (10.5.1)BATTERY ABNORMAL TEST (13.2.2) | 2020-10-23 | |
MEAS | IEC 61010-2-201:2017 | SINGLE FAULT CONDITION TESTS (4.4)COMPONENT ABNORMAL (4.4.1)PROTECTIVE IMPEDANCE ABNORMAL TEST (4.4.2.2)PROTECTIVE CONDUCTOR ABNORMAL TEST (4.4.2.3)SHORT TERM / INTERMITTENT DUTY ABNORMAL TEST (4.4.2.4)CAPACITOR SHORT CIRCUIT ABNORMAL TEST (4.4.2.6)MAINS TRANSFORMER SHORT CIRCUIT TEST (4.4.2.7.2)MAINS TRANSFORMER OVERLOAD TEST (4.4.2.7.3)OUTPUT ABNORMAL TEST (4.4.2.8)MULTI-SUPPLY ABNORMAL TEST (4.4.2.9)COOLING ABNORMAL TEST (4.4.2.10)INSULATION BETWEEN CIRCUITS AND PARTS ABNORMAL TEST (4.4.2.12)SUPPLY VOLTAGE SELECTOR TEST (4.4.2.14)MAINS SUPPLY (5.1.3)DURABILITY OF MARKINGS TEST (5.3)DETERMINATION OF ACCESSIBLE PARTS (6.2)LIMIT VALUES FOR ACCESSIBLE PARTS (6.3)GROUNDING CONTINUITY TEST (6.5.2.4 AND 6.5.2.5)INSULATION REQUIREMENTS (6.7, ANNEX K)DIELECTRIC VOLTAGE WITHSTAND TEST (6.8)HUMIDITY CONDITIONING TEST (6.8.2)RIGIDITY TEST (8.2.1)LIMITED ENERGY CIRCUIT DETERMINATION TEST (9.4)TEMPERATURE TEST (10.1-10.4)(61010-2-201,2ND ED. 10.4.1.100–10.4.1.103)RESISTANCE TO HEAT OF NONMETALLIC ENCLOSURE TEST (10.5.2):INTEGRITY OF CLEARANCES AND CREEPAGES TEST (10.5.1)BATTERY ABNORMAL TEST (13.2.2) | 2020-10-23 |