IEC 60269-4:1986

Title
Abstract

For application in equipment containing semiconductor devices for circuits up to 1000 V a.c. to circuits of nominal voltages up to 1500 V d.c. Establishes characteristics of semiconductor fuse-links in such a way that they can be replaced by other fuse-links having the same characteristics provided their dimensions are identical. Defines standard conditions for operation in service, characteristics of fuses, markings, standard conditions for construction and tests. Appendix A provides a guide for the coordination of fuse-links with semiconductor devices. Note: - To be read in conjunction with IEC 60269-1.

Issue Date

1986-10-15

Category

PROT

Included in IECEE System

2007-10-01

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Test Report Form

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Testing Equipment List

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DISCLAIMER: National differences

The National differences and Group differences, National Deviations and Special National conditions (SNC), are based solely on information provided to the Secretariat by the IECEE Member Bodies and/or NCBs and other sources. The IEC/IECEE is not responsible for, nor will it take any position related to, the accuracy or validity of the information provided. To verify the current status of this type of information, we recommend contacting the Member Body (MB) or National Certification Body (NCB) of the relevant country.

Group Differences are applicable for CENELEC member countries: Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.

No information declared

Id

Name

City

Country

13363

Warszawa

Poland

13361

Lysaker

Norway

13334

BRUSSELS 1070

Belgium

13342

Helsinki

Finland

13349

Budapest

Hungary

13340

Ballerup

Denmark