SEK Svensk Elstandard
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SEK Svensk Elstandard
| Country |
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| Address(es) |
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| Website | Not available |
| Acceptance date | No information declared |
| Certificates |
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| Voting member | |
| Contacts | Contacts
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DISCLAIMER: National differences
The National differences and Group differences, National Deviations and Special National conditions (SNC), are based solely on information provided to the Secretariat by the IECEE Member Bodies and/or NCBs and other sources. The IEC/IECEE is not responsible for, nor will it take any position related to, the accuracy or validity of the information provided. To verify the current status of this type of information, we recommend contacting the Member Body (MB) or National Certification Body (NCB) of the relevant country.
Group Differences are applicable for CENELEC member countries: Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.
Category | StandardId | Reference | Standard | Modified at | Download |
|---|---|---|---|---|---|
CAP | 15886 | SS IEC 384, SS 443 04 14 | IEC 60384-1:1982/AMD4:1992 | 2010-07-08 | Download170 kb |
CAP | 15908 | SS IEC 384, SS 443 04 14 | IEC 60384-14:1981 | 2010-07-08 | Download170 kb |
CAP | 18443 | not reported | IEC 60939-1:1988 | 2010-07-08 | Download155 kb |
CAP | 18446 | not reported | IEC 60939-2:1988/AMD1:1996 | 2011-09-16 | Download159 kb |
CONT | 3117 | SS-EN 60730-1 | IEC 60730-1:2013 | 2014-05-09 | Download98 kb |
CONT | 17482 | SS-EN 60730-1:2012 | IEC 60730-1:2010 | 2012-03-23 | Download100 kb |
HOUS | 15008 | SS EN 60335-1/A1/A2 | IEC 60335-1:1991/AMD2:1999 | 2010-07-08 | Download156 kb |
HOUS | 15007 | SS 433 07 01, 2nd ed | IEC 60335-1:1976/AMD2:1979 | 2010-07-08 | Download159 kb |
HOUS | 15475 | not reported | IEC 60335-2-7:1984/AMD2:1990 | 2010-07-08 | Download156 kb |
HOUS | 15101 | SS-EN 60335-2-16 | IEC 60335-2-16:1994 | 2010-07-08 | Download155 kb |
HOUS | 1556 | - | IEC 60335-2-21:2012 | 2013-03-04 | Download37 kb |
HOUS | 15128 | SS-EN 60335-2-21 ed.3 A1 | IEC 60335-2-21:2002/AMD1:2004 | 2010-07-08 | Download155 kb |
HOUS | 15130 | SS-EN 60335-2-21:2003 + A1:2005 + C1:2007 + A2:2009 | IEC 60335-2-21:2002/AMD2:2008 | 2010-06-01 | Download26 kb |
HOUS | 15131 | SS EN 60335-2-21 | IEC 60335-2-21:1989/AMD3:1992 | 2010-07-08 | Download156 kb |
HOUS | 15215 | not reported | IEC 60335-2-30:1990/AMD1:1990 | 2010-07-08 | Download157 kb |
HOUS | 15225 | SS EN 60335-2-31, 2nd ed | IEC 60335-2-31:1988/AMD1:1990 | 2010-07-08 | Download156 kb |
HOUS | 1596 | SS-EN 60335-2-35:2016 | IEC 60335-2-35:2012 | 2016-06-21 | Download37 kb |
HOUS | 15260 | SS-EN 60335-2-35 ed.3 | IEC 60335-2-35:2002 | 2010-06-01 | Download156 kb |
HOUS | 15255 | SS-EN 60335-2-35:2003+C1:2006+A1:2007+A2:2011 | IEC 60335-2-35:2002/AMD2:2009 | 2012-01-30 | Download14 kb |
HOUS | 15338 | not reported | IEC 60335-2-43:1984/AMD1:1988 | 2010-07-08 | Download156 kb |
HOUS | 15509 | Under development | IEC 60335-2-79:1995/AMD1:2000 | 2010-07-08 | Download155 kb |
HOUS | 15534 | se-nd-iec60335-2-86(ed.1).doc | IEC 60335-2-86:1998 | 2010-07-08 | Download155 kb |
INST | 14935 | SS 428 08 04 incl. A1,2,3 | IEC 60320:1981/AMD3:1987 | 2010-07-08 | Download156 kb |
INST | 16962 | not reported | IEC 60614-1:1978/AMD2:1984 | 2010-07-08 | Download156 kb |
INST | 2813 | SS EN 60669-1/A1 | IEC 60669-1:1998/AMD1:1999 | 2010-07-08 | Download158 kb |
INST | 2820 | SS-EN 60669-2-1:2005 | IEC 60669-2-1:2002 | 2009-11-27 | Download156 kb |
INST | 2819 | SS-EN 60669-2-1:2005 + C1:2008 + A1:2009 | IEC 60669-2-1:2002/AMD1:2008 | 2010-06-02 | Download15 kb |
INST | 2833 | SS-EN 60670-21:2007 | IEC 60670-21:2004 | 2010-06-02 | Download67 kb |
INST | 3801 | SS 428 08 34:2013 + SS-IEC 60884-1(ed.3) | IEC 60884-1:2002 | 2017-05-09 | Download2 Mb |
INST | 3798 | SS 428 08 34:2013 + SS-IEC 60884-1 | IEC 60884-1:2002/AMD1:2006 | 2017-05-09 | Download2 Mb |
INST | 3799 | SS 428 08 34:2013 + SS-IEC 60884-1 | IEC 60884-1:2002/AMD2:2013 | 2017-05-09 | Download2 Mb |
LITE | 16605 | SS-EN 60570/A1/A2 | IEC 60570:1995/AMD2:2000 | 2010-07-08 | Download156 kb |
LITE | 16706 | SS-EN 60598-1:2008 + A11:2009 | IEC 60598-1:2008 | 2010-06-02 | Download155 kb |
LITE | 16703 | SS-EN 60598-1:2004 | IEC 60598-1:2003 | 2010-06-02 | Download156 kb |
LITE | 16688 | SS-EN 60598:2004 + A1:2007 + C1:2007 | IEC 60598-1:2003/AMD1:2006 | 2010-06-02 | Download14 kb |
LITE | 16698 | SS-EN 60598-1 5th ed | IEC 60598-1:1999 | 2010-07-08 | Download155 kb |
LITE | 16687 | SS EN 60598-1, 4th ed. | IEC 60598-1:1996/AMD1:1998 | 2010-07-08 | Download156 kb |
LITE | 2576 | SS-EN 60598-2-7:1995 + A2:1996 + A13:1997 + A2C1:1999 | IEC 60598-2-7:1982/AMD2:1994 | 2010-06-02 | Download21 kb |
LITE | 16740 | SS-EN 60598-2-22, 1st ed. | IEC 60598-2-22:1990 | 2010-07-08 | Download155 kb |
MISC | 17996 | SS-EN 60825-1:2007 | IEC 60825-1:2007 | 2010-06-03 | Download65 kb |
MISC | 17990 | SS-EN 6025-1:2003 | IEC 60825-1:1993/AMD2:2001 | 2010-06-03 | Download65 kb |
OFF | 18580 | SS EN 60950, 6th ed | IEC 60950:1999 | 2010-07-08 | Download158 kb |
OFF | 18576 | SS-EN 60950, 5th ed | IEC 60950:1991/AMD4:1996 | 2010-07-08 | Download158 kb |
OFF | 4020 | SS-EN 60950-1:2006+A11:2009+A12:2011 | IEC 60950-1:2005 | 2011-04-19 | Download177 kb |
OFF | 4018 | SS-EN 60950-1:2006+A11:2009+A12:2011+A1:2010 | IEC 60950-1:2005/AMD1:2009 | 2011-04-19 | Download13 kb |
OFF | 4019 | SS-EN 60950-1:2006+A11:2009+A12:2011+A1:2010+A2:2013 | IEC 60950-1:2005/AMD2:2013 | 2013-10-31 | Download100 kb |
OFF | 18568 | SS-EN 60950-1 | IEC 60950-1:2001 | 2010-07-08 | Download160 kb |
OFF | 20258 | SS-EN 62040-1-1:2003 + C1:2004 | IEC 62040-1-1:2002 | 2010-06-03 | Download159 kb |
OFF | 20261 | SS-EN 62040-1-2:2003 + C1:2004 | IEC 62040-1-2:2002 | 2010-06-03 | Download160 kb |
PROT | 14465 | SS 4280539:2008 | IEC 60269-3:2006 | 2010-06-07 | Download13 kb |
PROT | 18305 | SS-EN 60898 | IEC 60898:1987/AMD3:1990 | 2010-07-08 | Download156 kb |
PROT | 18812 | SS-EN 61008-1 | IEC 61008-1:1990/AMD2:1995 | 2010-07-08 | Download164 kb |
PROT | 18821 | SS-EN 61009-1:2004+C1:2006+A11:2008+A12:2009+A13:2009+A14:2012+AC1:2013 | IEC 61009-1:1996/AMD2:2006 | 2013-01-31 | Download13 kb |
PROT | 18819 | SS-EN 61009-1 | IEC 61009-1:1991/AMD1:1995 | 2010-07-08 | Download166 kb |
SAFE | 19843 | SS-EN 61558-1/A1 | IEC 61558-1:1997/AMD1:1998 | 2010-07-08 | Download156 kb |
TRON | 494 | SS-EN 60065:2015+A11:2017 | IEC 60065:2014 | 2017-07-06 | Download122 kb |
TRON | 12600 | SS-EN 60065:2002+A11+A12+A1 | IEC 60065:2001/AMD1:2005 | 2011-04-19 | Download160 kb |
TRON | 12604 | SS-EN 60065:2002+A1:2006+A2:2010 | IEC 60065:2001/AMD2:2010 | 2011-04-19 | Download163 kb |
TRON | 12615 | SS-EN 60065 2nd edition | IEC 60065:1998 | 2010-07-08 | Download157 kb |
TRON | 16365 | SS 441 01 66 | IEC 60491:1984 | 2010-07-08 | Download160 kb |
Name | CBTLs | SPTLs | CTFs | I/R Standards in scope | R Standards in scope |
|---|---|---|---|---|---|
21 | 2 | 115 | 1973 | 251 |
Name | Country | Standards in scope | Responsible National Certification Body |
|---|---|---|---|
China | 20 | ||
United States of America | 152 | ||
United States of America | 54 | ||
Canada | 64 | ||
United States of America | 152 | ||
Germany | 837 | ||
United States of America | 84 | ||
Italy | 345 | ||
Japan | 102 | ||
Japan | 96 | ||
United States of America | 123 | ||
United States of America | 47 | ||
United States of America | 314 | ||
Sweden | 1435 | ||
China | 6 | ||
Hong Kong | 160 | ||
United States of America | 31 | ||
China | 1244 | ||
China | 188 | ||
Sweden | 40 | ||
China | 53 |
Specialized Testing Laboratory | Country | Standards in scope | Responsible National Certification Body |
|---|---|---|---|
Inspection Center of products’ Quality of Low Voltage Electric Apparatus in Zhejiang province | China | 0 | |
China | 0 |
Customer Testing Facility | Country | CTF Stage | Standards in scope | Acceptance Date | Responsible National Certification Body |
|---|---|---|---|---|---|
Sweden | 3 | 22 | 2009-12-11 | ||
Sweden | 3 | 15 | 2015-03-12 | ||
China | 2 | 9 | 2017-04-28 | ||
China | 2 | 14 | 2012-10-23 | ||
China | 2 | 4 | 2016-08-11 | ||
Finland | 2 | 5 | 2017-06-12 | ||
United States of America | 1 | 2 | 2019-07-11 | ||
China | 1 | 17 | 2015-10-19 | ||
Japan | 1 | 5 | 2015-04-02 | ||
Sweden | 1 | 2 | 2017-11-03 | ||
India | 1 | 4 | 2020-10-29 | ||
India | 2 | 14 | 2022-05-31 | ||
Italy | 2 | 6 | 2023-11-15 | ||
United States of America | 2 | 7 | 2024-02-13 | ||
United States of America | 2 | 7 | 2023-06-27 | ||
United States of America | 3 | 11 | 2013-08-22 | ||
China | 1 | 41 | 2016-02-19 | ||
Germany | 1 | 8 | 2009-06-03 | ||
United States of America | 2 | 6 | 2019-10-31 | ||
Hong Kong | 2 | 5 | 2019-09-01 | ||
China | 2 | 19 | 2019-11-07 | ||
Germany | 1 | 5 | 2020-07-03 | ||
Belgium | 3 | 17 | 2020-02-10 | ||
Italy | 3 | 4 | 2022-01-28 | ||
China | 2 | 14 | 2023-05-17 | ||
China | 2 | 26 | 2022-12-20 | ||
Finland | 3 | 9 | 2014-02-28 | ||
Switzerland | 4 | 4 | 2015-02-19 | ||
Japan | 2 | 4 | 2016-06-04 | ||
Japan | 2 | 3 | 2011-03-08 | ||
Japan | 3 | 23 | 2014-11-20 | ||
Japan | 1 | 3 | 2016-07-01 | ||
Japan | 1 | 7 | 2014-10-21 | ||
France | 2 | 17 | 2020-11-16 | ||
United States of America | 2 | 16 | 2021-04-18 | ||
Japan | 1 | 10 | 2016-11-21 | ||
Germany | 2 | 2 | 2018-09-06 | ||
United States of America | 3 | 18 | 2019-08-26 | ||
Sweden | 1 | 4 | 2019-11-18 | ||
United States of America | 3 | 7 | 2020-01-01 | ||
China | 2 | 20 | 2023-10-10 | ||
Italy | 2 | 11 | 2022-11-08 | ||
China | 2 | 6 | 2023-03-03 | ||
Norway | 1 | 6 | 2022-09-07 | ||
LS ELECTRIC Co., Ltd Power Testing & Technology Institute (2402) | Korea, Republic of | 2 | 4 | 2023-08-02 | |
Italy | 3 | 11 | 2010-10-25 | ||
Sweden | 2 | 4 | 2016-08-17 | ||
China | 1 | 5 | 2015-02-13 | ||
Sweden | 1 | 2 | 2019-04-24 | ||
Switzerland | 1 | 3 | 2023-04-25 | ||
Italy | 2 | 26 | 2020-11-16 | ||
United States of America | 2 | 7 | 2021-05-19 | ||
United States of America | 2 | 5 | 2020-02-01 | ||
Japan | 3 | 3 | 2020-03-10 | ||
Sweden | 1 | 12 | 2023-03-16 | ||
Japan | 1 | 2 | 2023-05-25 | ||
Italy | 2 | 10 | 2023-08-01 | ||
Germany | 1 | 1 | 2022-08-19 | ||
United States of America | 1 | 7 | 2022-12-13 | ||
Italy | 3 | 12 | 2010-10-25 | ||
Türkiye | 4 | 37 | 2016-01-05 | ||
Sweden | 1 | 4 | 2016-06-13 | ||
Italy | 2 | 18 | 2013-12-13 | ||
Sweden | 2 | 17 | 2001-01-19 | ||
Italy | 3 | 45 | 2019-04-16 | ||
Sweden | 1 | 5 | 2015-09-14 | ||
Finland | 1 | 7 | 2016-02-11 | ||
China | 2 | 17 | 2020-01-03 | ||
Germany | 2 | 6 | 2021-01-22 | ||
United States of America | 3 | 8 | 2017-06-15 | ||
Italy | 2 | 35 | 2021-10-08 | ||
United States of America | 3 | 11 | 2021-06-02 | ||
Sweden | 1 | 2 | 2020-06-09 | ||
Germany | 1 | 3 | 2023-01-19 | ||
Sweden | 1 | 2 | 2023-11-22 | ||
Italy | 1 | 1 | 2022-09-23 | ||
Sweden | 1 | 2 | 2022-10-24 | ||
Japan | 1 | 2 | 2022-10-24 | ||
Germany | 1 | 2 | 2021-11-26 | ||
Poland | 2 | 2 | 2024-01-24 | ||
China | 2 | 5 | 2012-08-21 | ||
Sweden | 1 | 5 | 2016-06-07 | ||
Germany | 3 | 4 | 2020-11-11 | ||
India | 1 | 3 | 2020-09-04 | ||
India | 1 | 1 | 2020-01-03 | ||
Austria | 2 | 6 | 2020-04-10 | ||
China | 2 | 19 | 2019-07-15 | ||
China | 2 | 2 | 2023-03-03 | ||
China | 2 | 13 | 2024-04-03 | ||
Finland | 3 | 2 | 2022-09-14 | ||
Japan | 1 | 28 | 2016-06-02 | ||
Japan | 3 | 11 | 2015-03-12 | ||
Sweden | 2 | 13 | 2015-01-12 | ||
China | 1 | 43 | 2012-12-11 | ||
Italy | 2 | 18 | 2020-02-04 | ||
China | 2 | 2 | 2020-06-12 | ||
India | 1 | 4 | 2018-09-06 | ||
Testing Center of Qingdao Hisense Electronics Technology Service Co., Ltd. | China | 2 | 3 | 2019-12-03 | |
Johnson Controls-Hitachi Air Conditioning Technology (Wuxi) Co., Ltd. | China | 2 | 6 | 2020-03-17 | |
Sweden | 1 | 3 | 2020-12-31 | ||
Germany | 1 | 4 | 2024-03-12 | ||
Sweden | 1 | 2 | 2023-05-25 | ||
United States of America | 2 | 1 | 2022-03-04 | ||
Italy | 3 | 25 | 2010-01-01 | ||
United States of America | 4 | 3 | 2014-03-20 | ||
United States of America | 3 | 11 | 2016-04-06 | ||
Sweden | 1 | 20 | 2015-05-29 | ||
Sweden | 3 | 11 | 2019-06-04 | ||
United States of America | 1 | 13 | 2024-04-10 | ||
FUJIFILM Healthcare Manufacturing Corporation, Minamiashigara Takematsu Office | Japan | 1 | 13 | 2020-08-14 | |
Italy | 1 | 1 | 2022-09-26 | ||
United States of America | 3 | 17 | 2022-01-10 | ||
Inter Testing & Consulting Services (Shanghai) Co., Ltd (2311) | China | 2 | 15 | 2022-01-19 | |
Italy | 2 | 14 | 2024-03-26 | ||
China | 2 | 2 | 2023-05-23 |