Transistor Devices Inc.
Transistor Devices Inc.
| Address(es) |
|
| Website | Not available |
| Status | MEMBER |
| Acceptance date | 2022-12-08 |
Further information
Stage | Country | Name |
|---|---|---|
3 | Germany |
LEGEND: Scope Limitations
- RA : Audio amplifiers with audio power > 0,5 Watts excluded
- RC : Apparatus with connection(s) to a cable distribution system excluded
- RSH : Shredders excluded
- RT : Apparatus with connection(s) to a telecommunication network excluded
- RV : CRT (cathode ray tubes)/ picture tubes, plasma/LCD or other video apparatus excluded
- ROUT : Equipment intended for installation outdoors excluded
- RWPT : Wireless power transmitter excluded
Category | Name | Tests/Clauses | Acceptance Date | Responsible National Certification Body |
|---|---|---|---|---|
ITAV | IEC 62368-1:2018 | B.2.5: Input Test Single Phase and Poly Phase5.4.1.4, 6.3.2, 9.0, B.2.6: Heating5.4.1.8: Determination of Working Voltage5.4.9: Electric Strength5.7.2.2: Touch Current Single Phase and Poly Phase5.6.6.2: Protective Bonding ResistanceAnnex B.4: Simulated Single Fault ConditionsAnnex B.3: Simulated Abnormal Operation Conditions | 2022-12-08 | |
ITAV | IEC 62368-1:2014 | B.2.5: Input Test Single Phase and Poly Phase5.4.1.4, 6.3.2, 9.0, B.2.6: Heating5.4.1.8: Determination of Working Voltage5.4.9: Electric Strength5.7.2.2: Touch Current Single Phase and Poly Phase5.6.6.2: Protective Bonding ResistanceAnnex B.4: Simulated Single Fault ConditionsAnnex B.3: Simulated Abnormal Operation Conditions | 2022-12-08 | |
OFF | IEC 60950-1:2005 | 1.6.2: Input Test Single Phase and Poly Phase2.1.1.7: Capacitance Discharge2.10.2: Determination of Working Voltage2.2: Measurement Test SELV circuits2.6.3.4, 2.6.1: Protective Bonding Resistance4.5: Heating5.1, Annex D: Touch Current Single Phase and Poly Phase5.2.2: Electric Strength5.3.1, 5.3.4, 5.3.7: Component Failure5.3.1, 5.3.9: Abnormal Operation5.3.7: Power Supply Output Short Circuit and Overload | 2022-12-08 | |
OFF | IEC 60950-1:2005/AMD1:2009 | 1.6.2: Input Test Single Phase and Poly Phase2.1.1.7: Capacitance Discharge2.10.2: Determination of Working Voltage2.2: Measurement Test SELV circuits2.6.3.4, 2.6.1: Protective Bonding Resistance4.5: Heating5.1, Annex D: Touch Current Single Phase and Poly Phase5.2.2: Electric Strength5.3.1, 5.3.4, 5.3.7: Component Failure5.3.1, 5.3.9: Abnormal Operation5.3.7: Power Supply Output Short Circuit and Overload | 2022-12-08 | |
OFF | IEC 60950-1:2005/AMD2:2013 | 1.6.2: Input Test Single Phase and Poly Phase2.1.1.7: Capacitance Discharge2.10.2: Determination of Working Voltage2.2: Measurement Test SELV circuits2.6.3.4, 2.6.1: Protective Bonding Resistance4.5: Heating5.1, Annex D: Touch Current Single Phase and Poly Phase5.2.2: Electric Strength5.3.1, 5.3.4, 5.3.7: Component Failure5.3.1, 5.3.9: Abnormal Operation5.3.7: Power Supply Output Short Circuit and Overload | 2022-12-08 |