Bel Power Solutions, s.r.o.
Bel Power Solutions, s.r.o.
| Address(es) |
|
| Website | Not available |
| Status | MEMBER |
| Acceptance date | 2020-12-18 |
Further information
Stage | Country | Name |
|---|---|---|
3 | Norway |
LEGEND: Scope Limitations
- RA : Audio amplifiers with audio power > 0,5 Watts excluded
- RC : Apparatus with connection(s) to a cable distribution system excluded
- RSH : Shredders excluded
- RT : Apparatus with connection(s) to a telecommunication network excluded
- RV : CRT (cathode ray tubes)/ picture tubes, plasma/LCD or other video apparatus excluded
- ROUT : Equipment intended for installation outdoors excluded
- RWPT : Wireless power transmitter excluded
Category | Name | Tests/Clauses | Acceptance Date | Responsible National Certification Body |
|---|---|---|---|---|
ITAV | IEC 62368-1:2023 | Accepted clauses: 5.2.2.4 Steady state voltage and current limits, 5.2.2.5 Capacitance limits; 5.2.2.4 Single pulse limits, 5.3.2 Accessibility to electrical energy sources and safeguards, 5.4.1.4 Maximum operating temperatures for materials, components and systems, 5.4.1.10.3 Ball pressure test, 5.4.2 Clearances, 5.4.3 Creepage distances, 5.4.8 Humidity conditioning, 5.4.9 Electric strength, 5.5.2.2 Safeguards against capacitor discharge after disconnection of a connector, 5.6.4 Requirements for protective bonding conductors, 5.7 Prospective touch voltage, touch current and protective conductor current, 6.2.2 Power source circuit classifications, Annex B.2.5 Input test, B.3.2 Covering of ventilation openings, F.3.10 Test for the permanence of markings, Annex R Limited short-circuit test , T.2 to T.6 Mechanical strength tests, V.1.2 Accessible parts of equipment – Test method 1 (Test probe V.1 and V.2), Surfaces and openings tested with jointed test probes, V.1.3 Accessible parts of equipment – Test method 2 Openings tested with straight unjointed test probes (Test probe V.1 and V.2 | 2023-12-21 | |
ITAV | IEC 62368-1:2018 | Accepted clauses:5.2.2.2 Steady state voltage and current limits,5.2.2.3 Capacitance limits; 5.2.2.4 Single pulse limits,5.3.2 Accessibility to electrical energy sources andsafeguards, 5.4.1.4 Maximum operating temperatures formaterials, components and systems, 5.4.1.10.3 Ballpressure test, 5.4.2 Clearances, 5.4.3 Creepagedistances, 5.4.8 Humidity conditioning, 5.4.9 Electricstrength, 5.5.2.2 Safeguards against capacitor dischargeafter disconnection of a connector, 5.6.4 Requirements forprotective bonding conductors, 5.7 Prospective touchvoltage, touch current and protective conductor current,6.2.2 Power source circuit classifications, Annex B.2.5Input test, B.3.2 Covering of ventilation openings, F.3.10Test for the permanence of markings, T.2 to T.6Mechanical strength tests, V.1.2 Accessible parts ofequipment – Test method 1 (Test probe V.1 and V.2),Surfaces and openings tested with jointed test probes,V.1.3 Accessible parts of equipment – Test method 2Openings tested with straight unjointed test probes (Testprobe V.1 and V.2).Annex R Limited short-circuit test | 2020-12-18 | |
ITAV | IEC 62368-1:2014 | Accepted clauses:5.2.2.2 Steady state voltage and current limits,Capacitance limits; 5.2.2.4 Single pulse limits, 5.3.2Accessibility to electrical energy sources and safeguards,5.4.1.4 Maximum operating temperatures for materials,components and systems, 5.4.1.10.3 Ball pressure test,5.4.2 Clearances, 5.4.3 Creepage distances, 5.4.8Humidity conditioning, 5.4.9 Electric strength, 5.5.2.2Safeguards against capacitor discharge afterdisconnection of a connector, 5.6.4 Requirements forprotective bonding conductors, 5.7 Prospective touchvoltage, touch current and protective conductor current,6.2.2 Power source circuit classifications, Annex B.2.5Input test, B.3.2 Covering of ventilation openings, F.3.10Test for the permanence of markings, T.2 to T.6Mechanical strength tests, V.1.2 Accessible parts ofequipment – Test method 1 (Test probe V.1 and V.2),Surfaces and openings tested with jointed test probes,V.1.3 Accessible parts of equipment – Test method 2Openings tested with straight unjointed test probes (Testprobe V.1 and V.2). Annex R Limited short-circuit test | 2020-12-18 |