IEC 61000-4-29:2000 |
IEC 61000-4-29:2000
Title |
Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests |
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Abstract |
Establishes a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on d.c. power ports. This standard defines: - the range of test levels; - the test generator; - the test set-up; - the test procedure. |
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Issue date |
2000-08-30 |
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Category |
EMC |
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Included in IECEE System |
2007-10-01 |
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Test Report Form |
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Testing Equipment List |
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