CTF

Agilent Technologies (Shanghai) Co., Ltd.

 
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Standards in Scope - WITHDRAWN

Category
Standard
Tests/Clauses
Acceptance Date
Responsible National Certification Body(s)
MEASIEC 61010-1:2010
All clause except: Clause 11.6 Specially protected equipment Clause 12.2 Equipment producing ionizing radiation Clause 12.3 Ultraviolet radiation Clause 12.4 Microwave radiation Clause 12.5 Sonic and ultrasonic pressure Clause 12.6 Laser sources Clause 11.7 Fluid pressure and leakage
MEASIEC 61010-1:2010/AMD1:2016
All clause except: Clause 11.6 Specially protected equipment Clause 12.2 Equipment producing ionizing radiation Clause 12.3 Ultraviolet radiation Clause 12.4 Microwave radiation Clause 12.5 Sonic and ultrasonic pressure Clause 12.6 Laser sources Clause 11.7 Fluid pressure and leakage
MEASIEC 61010-1:2001
All clause except: Clause 11.6 Specially protected equipment Clause 12.2 Equipment producing ionizing radiation Clause 12.3 Ultraviolet radiation Clause 12.4 Microwave radiation Clause 12.5 Sonic and ultrasonic pressure Clause 12.6 Laser sources Clause 11.7 Fluid pressure and leakage
MEASIEC 61010-2-010:2014
All clause except: Clause 8.2.101 Dynamic test of horizontal heating surfaces of glass or ceramic material
MEASIEC 61010-2-010:2003
All clause except: Clause 8.2.101 Dynamic test of horizontal heating surfaces of glass or ceramic material
MEASIEC 61010-2-081:2015
All clauses
MEASIEC 61010-2-081:2001
All clauses
MEASIEC 61010-2-081:2001/AMD1:2003
All clauses