CTF

ABB Oy, Smart Power, Testing Laboratory LSX

 
  •  

Standards in Scope

Category
Standard
Tests/Clauses
Acceptance Date
Responsible National Certification Body(s)
POWIEC 60947-1:2007
All clauses except: cl. 7.1.2, cl. 7.2.3.3 clearance and creepage measurements of electronic circuits, cl. 7.2.3.4 clearance and creepage measurements of electronic circuits, cl. 8.4, Annexes C, Q, X, M, T, U, S and K.
2015-01-29
POWIEC 60947-1:2007/AMD1:2010
All clauses except: cl. 7.1.2, cl. 7.2.3.3 clearance and creepage measurements of electronic circuits, cl. 7.2.3.4 clearance and creepage measurements of electronic circuits, cl. 8.4, Annexes C, Q, X, M, T, U, S and K.
2015-01-29
POWIEC 60947-1:2007/AMD2:2014
All clauses except: cl. 7.1.2, cl. 7.2.3.3 clearance and creepage measurements of electronic circuits, cl. 7.2.3.4 clearance and creepage measurements of electronic circuits, cl. 8.4, Annexes C, Q, X, M, T, U, S and K.
2015-01-29
POWIEC 60947-3:2008
All clauses except: cl.7.1.2, cl.7.1.12 (Annex C, st. 60947-1) and cl.7.3
2015-01-29
POWIEC 60947-3:2008/AMD1:2012
All clauses except: cl.7.1.2, cl.7.1.12 (Annex C, st. 60947-1) and cl.7.3
2015-01-29
POWIEC 60947-3:2008/AMD2:2015
All clauses except: cl.7.1.2, cl.7.1.12 (Annex C, st. 60947-1) and cl.7.3
2017-12-19
POWIEC 60947-4-1:2009
All clauses except: cl. 8.1.2 (cl.7.1.2 and Annex C, st. 60947-1), cl. 8.3
2015-01-29
POWIEC 60947-4-1:2009/AMD1:2012
All clauses except: cl. 8.1.2 (cl.7.1.2 and Annex C, st. 60947-1), cl. 8.3
2015-01-29
POWIEC 60947-5-1:2003
All clauses except: cl. 7.1 (Annex C, st.60947-1), cl.7.1.1, cl. 7.3 and Annex K
2015-01-29
POWIEC 60947-5-1:2003/AMD1:2009
All clauses except: cl. 7.1 (Annex C, st.60947-1), cl.7.1.1, cl. 7.3 and Annex K
2015-01-29
POWIEC 60947-6-1:2005
All clauses except: cl. 8.1.1.1, cl. 8.1(cl.7.1.2, and Annex C st.60947-1) cl. 8.3
2015-01-29
POWIEC 60947-6-1:2005/AMD1:2013
All clauses except: cl. 8.1.1.1, cl. 8.1(cl.7.1.2, and Annex C st.60947-1) cl. 8.3
2015-01-29