CTF

Fluke Corporation

 
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Standards in Scope

Category
Standard
Tests/Clauses
Acceptance Date
Responsible National Certification Body(s)
BATTIEC 62133:2012
All clauses except (not including cells): 7.2.1 Low rate charging 7.3.1 Incorrect Installation 7.3.5 Thermal abuse 7.3.6 Crush 7.3.9 Forced discharge 8.2.1 Continuous charge 8.3.1 External short circuit 8.3.4 Thermal abuse 8.3.5 Crush 8.3.7 Forced Discharge 8.3.8 Transport 8.3.9 Forced internal short 10.1 Cell marking
BATTIEC 62133-1:2017
IEC 62133-1:2017: Includes all clauses except (cells): 7.2.1 , 7.3.1, 7.3.5, 7.3.6, 7.3.7, 7.3.9; IEC 62133-2:2017: All clauses except (cells): 7.2.1, 7.3.1, 7.3.4, 7.3.5, 7.3.7, 7.3.9
2019-07-23
BATTIEC 62133-2:2017
IEC 62133-1:2017: Includes all clauses except (cells): 7.2.1 , 7.3.1, 7.3.5, 7.3.6, 7.3.7, 7.3.9; IEC 62133-2:2017: All clauses except (cells): 7.2.1, 7.3.1, 7.3.4, 7.3.5, 7.3.7, 7.3.9
2019-07-23
MEASIEC 61010-1:2010
IEC 61010-1 – Includes all clauses except: 12.2 Equipment producing ionizing radiation 12.3 Ultraviolet (UV) radiation 12.4 Microwave radiation 12.5 Ultrasonic pressure; IEC 62133-2012: All clauses except (not including cells): 7.2.1 Low rate charging 7.3.1 Incorrect Installation 7.3.5 Thermal abuse 7.3.6 Crush 7.3.9 Forced discharge 8.2.1 Continuous charge 8.3.1 External short circuit 8.3.4 Thermal abuse 8.3.5 Crush 8.3.7 Forced Discharge 8.3.8 Transport 8.3.9 Forced internal short 10.1 Cell marking;
MEASIEC 61010-1:2010/AMD1:2016
IEC 61010-1 – Includes all clauses except: 12.2 Equipment producing ionizing radiation 12.3 Ultraviolet (UV) radiation 12.4 Microwave radiation 12.5 Ultrasonic pressure; IEC 62133-2012: All clauses except (not including cells): 7.2.1 Low rate charging 7.3.1 Incorrect Installation 7.3.5 Thermal abuse 7.3.6 Crush 7.3.9 Forced discharge 8.2.1 Continuous charge 8.3.1 External short circuit 8.3.4 Thermal abuse 8.3.5 Crush 8.3.7 Forced Discharge 8.3.8 Transport 8.3.9 Forced internal short 10.1 Cell marking;
2019-07-23
MEASIEC 61010-1:2001
IEC 61010-1 – Includes all clauses except: 12.2 Equipment producing ionizing radiation 12.3 Ultraviolet (UV) radiation 12.4 Microwave radiation 12.5 Ultrasonic pressure; IEC 62133-2012: All clauses except (not including cells): 7.2.1 Low rate charging 7.3.1 Incorrect Installation 7.3.5 Thermal abuse 7.3.6 Crush 7.3.9 Forced discharge 8.2.1 Continuous charge 8.3.1 External short circuit 8.3.4 Thermal abuse 8.3.5 Crush 8.3.7 Forced Discharge 8.3.8 Transport 8.3.9 Forced internal short 10.1 Cell marking;
MEASIEC 61010-2-010:2019
All clauses
2109-07-23
MEASIEC 61010-2-010:2014
All clauses
MEASIEC 61010-2-030:2017
All clauses
2019-07-23
MEASIEC 61010-2-030:2010
All Clauses
MEASIEC 61010-2-032:2012
All clauses
MEASIEC 61010-2-032:2002
All Clauses
MEASIEC 61010-2-033:2012
All clauses
MEASIEC 61010-031:2015
All clauses
MEASIEC 61010-031:2002
All Clauses
MEASIEC 61010-031:2002/AMD1:2008
All Clauses