CTF

Delta Electronics, Inc.

 
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Standards in Scope

Category
Standard
Tests/Clauses
Acceptance Date
Responsible National Certification Body(s)
BATTIEC 62619:2017
7.2.1 External Short-Circuit Test (Cell) 7.2.3.2 Whole Drop Test 7.2.3.3 Edge & Corner Drop Test 7.2.4 Thermal Abuse Test (Cell) 7.2.5 Overcharge Test (Cell) 7.2.6 Forced Discharge Test (Cell) 7.3.2 Internal Short-Circuit Test (Cell) 7.3.3 Propagation Test 8.2.2 Overcharge Control Of Voltage Test 8.2.3 Overcharge Control Of Current Test 8.2.4 Overheating Control Test
2019-10-30
OFFIEC 62040-1:2008
4.6, 1.6.1/RD, 1.6.2/RD, 1.6.4/RD POWER INTERFACES 0 5.1.1, 2.1.7/RD CAPACITANCE DISCHARGE TEST 0 5.2.1, 2.2/RD SAFETY EXTRA LOW VOLTAGE CIRCUITS – SELV 0 5.2.3 LIMITED CURRENT CIRCUITS 0 5.1.4, ANNEX I BACKFEED PROTECTION 0 5.2.5, 2.5/RD LIMITED POWER SOURCE 0 5.3, 2.6.4/RD EARTHING TEST II 0 5.7 DETERMINATION OF WORKING VOLTAGE - WORKING VOLTAGE MEASUREMENT TEST 0 7.2, 4.1/RD Stability Tests 0 7.4, 4.5.5/RD Ball pressure test 0 7.7, 4.5/RD TEMPERATURE RISE 0 8.1, 5.1.1/RD GENERAL PROVISIONS FOR EARTH LEAKAGE 0 8.2, 5.2/RD ELECTRIC STRENGTH 0 8.3.2 COMPONENT SHORT AND OPEN CIRCUIT 0 8.3.2 TRANSFORMER ABNORMAL OPERATION 0 8.3 ABNORMAL OPERATING AND FAULT CONDITION 0 8.3.3 CONDITIONS FOR TESTS, FORESEEABLE MISUSE - OUTPUT OVERLOAD ABNORMAL TEST 0
2019-06-06
OFFIEC 62040-1:2008/AMD1:2013
4.6, 1.6.1/RD, 1.6.2/RD, 1.6.4/RD POWER INTERFACES 0 5.1.1, 2.1.7/RD CAPACITANCE DISCHARGE TEST 0 5.2.1, 2.2/RD SAFETY EXTRA LOW VOLTAGE CIRCUITS – SELV 0 5.2.3 LIMITED CURRENT CIRCUITS 0 5.1.4, ANNEX I BACKFEED PROTECTION 0 5.2.5, 2.5/RD LIMITED POWER SOURCE 0 5.3, 2.6.4/RD EARTHING TEST II 0 5.7 DETERMINATION OF WORKING VOLTAGE - WORKING VOLTAGE MEASUREMENT TEST 0 7.2, 4.1/RD Stability Tests 0 7.4, 4.5.5/RD Ball pressure test 0 7.7, 4.5/RD TEMPERATURE RISE 0 8.1, 5.1.1/RD GENERAL PROVISIONS FOR EARTH LEAKAGE 0 8.2, 5.2/RD ELECTRIC STRENGTH 0 8.3.2 COMPONENT SHORT AND OPEN CIRCUIT 0 8.3.2 TRANSFORMER ABNORMAL OPERATION 0 8.3 ABNORMAL OPERATING AND FAULT CONDITION 0 8.3.3 CONDITIONS FOR TESTS, FORESEEABLE MISUSE - OUTPUT OVERLOAD ABNORMAL TEST 0
2019-06-06