CTF

Delta Electronics, Inc.

 
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Standards in Scope

Category
Standard
Tests/Clauses
Acceptance Date
Responsible National Certification Body(s)
MEASIEC 61010-1:2010
4.4 SINGLE FAULT CONDITION TESTS 4.4.2 COMPONENT ABNORMAL 4.4.2.2 PROTECTIVE IMPEDANCE ABNORMAL TEST 4.4.2.3 PROTECTIVE CONDUCTOR ABNORMAL TEST 4.4.2.7.2 MAINS TRANSFORMER SHORT CIRCUIT TEST 4.4.2.7.3 MAINS TRANSFORMER OVERLOAD TEST 4.4.2.8 OUTPUT ABNORMAL TEST 4.4.2.10 COOLING ABNORMAL TEST 5.1.3 MAINS SUPPLY 5.3 DURABILITY OF MARKINGS TEST 6.2 DETERMINATION OF ACCESSIBLE PARTS 6.3 LIMIT VALUES FOR ACCESSIBLE PARTS 6.5.2.3 TIGHTENING TORQUE TEST 6.5.2.4 & 6.5.2.5 GROUNDING CONTINUITY TEST 6.7, Annex K INSULATION REQUIREMENTS 6.8 DIELECTRIC VOLTAGE WITHSTAND TEST 6.8.2 HUMIDITY CONDITIONING TEST 6.10.3c PLUGS AND CONNECTORS 7.5.2 HANDLES AND GRIPS 8.2.1 RIGIDITY TEST 8.2.2 IMPACT TEST 8.3.1 DROP TEST OTHER THAN HAND-HELD EQUIPMENT AND DIRECT PLUG-IN EQUIPMENT 10.1-10.4 TEMPERATURE TEST 10.5.1 INTEGRITY OF CLEARANCES AND CREEPAGE TEST 10.5.2 RESISTANCE TO HEAT OF NONMETALLIC ENCLOSURE TEST 10.5.3 BALL PRESSURE TEST
2019-03-20
MEDIEC 60601-1:2005
4.11 Power Input test 8.4.3 Voltage Limitation – Part 1 8.4.4 Voltage Limitation – Part 2 8.4.2 Low Voltage Reliability 8.7 Leakage Current 8.5.4 Working Voltage Measurements 8.6.4 a) Earthing and Potential Equalization test 8.8.3 Dielectric Voltage Withstand 8.8.4.1 Ball Pressure 11.1.1 Temperature 5.7 Humidity Preconditioning Treatment 13.2 Abnormal Operation and Fault Conditions 15.3 Mechanical Strength 15.3.4 Drop Test 15.3.6 Mold Stress Relief test 15.5.1 Transformer Overload and Short-circuit tests 11.8 Interruption of Power Supply
2019-01-24
MEDIEC 60601-1:2005/AMD1:2012
4.11 Power Input test 8.4.3 Voltage Limitation – Part 1 8.4.4 Voltage Limitation – Part 2 8.4.2 Low Voltage Reliability 8.7 Leakage Current 8.5.4 Working Voltage Measurements 8.6.4 a) Earthing and Potential Equalization test 8.8.3 Dielectric Voltage Withstand 8.8.4.1 Ball Pressure 11.1.1 Temperature 5.7 Humidity Preconditioning Treatment 13.2 Abnormal Operation and Fault Conditions 15.3 Mechanical Strength 15.3.4 Drop Test 15.3.6 Mold Stress Relief test 15.5.1 Transformer Overload and Short-circuit tests 11.8 Interruption of Power Supply
2019-01-24
MEDIEC 60601-1:1988
7.1 Power Input test 15 b) Voltage Limitation – Part 1 15 c) Voltage Limitation – Part 2 16 e) Low Voltage Reliability 19 Leakage Current 20.3 Working Voltage Measurements 18 f) Earthing and Potential Equalization test 20.4 Dielectric Voltage Withstand 59.2 Ball Pressure 42 Temperature 44.5 Humidity Preconditioning Treatment 52 Abnormal Operation and Fault Conditions 21 Mechanical Strength 21.5, 21.6 Drop Test 57.9.1 Transformer Overload and Short-circuit tests 49 Interruption of Power Supply -- Mold Stress Relief test
2020-03-30
MEDIEC 60601-1:1988/AMD1:1991
7.1 Power Input test 15 b) Voltage Limitation – Part 1 15 c) Voltage Limitation – Part 2 16 e) Low Voltage Reliability 19 Leakage Current 20.3 Working Voltage Measurements 18 f) Earthing and Potential Equalization test 20.4 Dielectric Voltage Withstand 59.2 Ball Pressure 42 Temperature 44.5 Humidity Preconditioning Treatment 52 Abnormal Operation and Fault Conditions 21 Mechanical Strength 21.5, 21.6 Drop Test 57.9.1 Transformer Overload and Short-circuit tests 49 Interruption of Power Supply -- Mold Stress Relief test
2020-03-30
MEDIEC 60601-1:1988/AMD2:1995
7.1 / 4.11 / 4.11 15B / 8.4.3 / 8.4.3 16E / 8.4.2 / 8.4.2 19 / 8.7 / 8.7 20.3 / 8.5.4 / 8.5.4 18f / 8.6.4a / 8.6.4a 20.4/ 8.8.3 / 8.8.3 59.2 / 8.8.4.1 / 8.8.4.1 42/ 11.1.1 / 11.1.1 44.5/ 5.7 / 5.7 52 / 13.2 / 13.2 21 / 15.3/ 15.3 21.5, 21.6 / 15.3.4 / 15.3.4 -- / 15.3.6/ 15.3.6 57.9.1/ 15.5.1 / 15.5.1 49/ 11.8 / 11.8
2020-03-30
OFFIEC 60950-1:2005
1.2.2.1 1.6.2 1.6.2 1.7.11 2.1.1.5, 2.1.2, 1.2.8.10 2.1.1.7 2.2.2, 2.2.3, 2.2.4, PART 22 6.1 2.4.1, 2.4.2 2.5 2.6.3.4 2.6.3.4, 2.6.1 2.6.3.4, 2.6.1 2.6.4.1, 3.3.1 2.7 2.9.1, 2.9.2, 5.2.2 2.10.2 2.10.2 2.10.5.8, ANNEX AA 2.10.5.9, 2.10.5.10, 2.10.5.6 2.10.5.13 2.10.8, 2.10.9 2.10.10, 2.10.9 2.10.11, 2.10.9 3.2.6, 4.2.1, 4.2.7 4.1 4.2.1 - 4.2.4 4.2.5, 4.2.1, PART 22 10.2 4.2.6, 4.2.1 4.2.7, 4.2.1 4.2.10 4.2.11.1 4.3.1 4.3.2 4.3.5 4.3.6 4.4.2, 4.4.4 4.5.1, 1.4.12, 1.4.13 4.5.5, 4.5 4.6.5 5.1, ANNEX D 5.1, ANNEX D 5.1, ANNEX D 5.2.2 5.3.1, 5.3.4, 5.3.7 5.3.1, 5.3.9 5.3.3, 5.3.7b, ANNEX C.1 5.3.7 5.3.7 ANNEX B.7 4.7 4.7 4.7 4.7 4.7 4.7 5.2, 5.7 5.2.1.1 5.4.1.4, Annex B.2 5.4.1.5.2 5.4.1.8 5.4.1.10.3 5.4.2.4 5.4.4.6.2 5.4.7, 5.4.1.5.3 (5.4.4.4, 5.4.4.5) 5.4.8 5.4.9 5.5.2.2 5.5.8 5.6.6.2(a), 5.6.6.2(b), 5.6.6.4.2(c), 5.6.6.4.2(d), 5.6.6.2(e) 5.7 5.7.5 6.2.2.2, 6.2.2.3 6.2.3.1 6.2.3.2 6.3 6.4.3, ANNEX B.4 6.4.3.3 6.6 8.5.3, ANNEX T.8, ANNEX V 8.8 ANNEX B.2.5 ANNEX B.2.5 ANNEX B.2.6 ANNEX B.3 ANNEX B.4 6.4.2, ANNEX B.4 ANNEX F.3.10 ANNEX G.5.3.3 ANNEX G.5.3.3.3 ANNEX G.5.4.6.3 ANNEX G.7.3.2 ANNEX G.10.2 ANNEX G.13.6 ANNEX G.14 ANNEX G.16 ANNEX P.2.3.2 ANNEX Q.1 ANNEX T.2 (5.4.2.6, 5.4.3.2, G.15.3.6) ANNEX T.3 (4.4.4.2, 4.4.4.5, 5.3.2.3, G.15.3.6, U.3) ANNEX T.4 (4.4.4.2) ANNEX T.4 (4.4.4.2) ANNEX T.6 (4.4.4.4, 8.10.4) ANNEX T.7 (4.4.4.3) ANNEX T.8 (4.4.4.1, 4.4.4.7, 4.8.4.2, 8.6.1, 8.7.2, 8.10.6, G.7.3.2.4) 4.4.4.2, (T.4), (T.5) 4.4.4.3, T.7 4.4.4.4, T.6 4.4.4.5, T.3 4.4.4.7, T.8 4.7 5.2.2.2 5.4.1.4, 6.3.2, 9 5.4.1.5.2 5.4.1.8 5.4.1.10.3 5.4.2, 5.4.3 5.4.2.6, T.2 5.4.8 5.4.9.1 5.5.2.2 5.5.8 6.2.2 6.6 B.2.5 B.3, B.4 G.5.3.3 G.13.6 G.14 Q.1 P.2.3.2
2019-09-05
OFFIEC 60950-1:2005/AMD1:2009
1.2.2.1 1.6.2 1.6.2 1.7.11 2.1.1.5, 2.1.2, 1.2.8.10 2.1.1.7 2.2.2, 2.2.3, 2.2.4, PART 22 6.1 2.4.1, 2.4.2 2.5 2.6.3.4 2.6.3.4, 2.6.1 2.6.3.4, 2.6.1 2.6.4.1, 3.3.1 2.7 2.9.1, 2.9.2, 5.2.2 2.10.2 2.10.2 2.10.5.8, ANNEX AA 2.10.5.9, 2.10.5.10, 2.10.5.6 2.10.5.13 2.10.8, 2.10.9 2.10.10, 2.10.9 2.10.11, 2.10.9 3.2.6, 4.2.1, 4.2.7 4.1 4.2.1 - 4.2.4 4.2.5, 4.2.1, PART 22 10.2 4.2.6, 4.2.1 4.2.7, 4.2.1 4.2.10 4.2.11.1 4.3.1 4.3.2 4.3.5 4.3.6 4.4.2, 4.4.4 4.5.1, 1.4.12, 1.4.13 4.5.5, 4.5 4.6.5 5.1, ANNEX D 5.1, ANNEX D 5.1, ANNEX D 5.2.2 5.3.1, 5.3.4, 5.3.7 5.3.1, 5.3.9 5.3.3, 5.3.7b, ANNEX C.1 5.3.7 5.3.7 ANNEX B.7 4.7 4.7 4.7 4.7 4.7 4.7 5.2, 5.7 5.2.1.1 5.4.1.4, Annex B.2 5.4.1.5.2 5.4.1.8 5.4.1.10.3 5.4.2.4 5.4.4.6.2 5.4.7, 5.4.1.5.3 (5.4.4.4, 5.4.4.5) 5.4.8 5.4.9 5.5.2.2 5.5.8 5.6.6.2(a), 5.6.6.2(b), 5.6.6.4.2(c), 5.6.6.4.2(d), 5.6.6.2(e) 5.7 5.7.5 6.2.2.2, 6.2.2.3 6.2.3.1 6.2.3.2 6.3 6.4.3, ANNEX B.4 6.4.3.3 6.6 8.5.3, ANNEX T.8, ANNEX V 8.8 ANNEX B.2.5 ANNEX B.2.5 ANNEX B.2.6 ANNEX B.3 ANNEX B.4 6.4.2, ANNEX B.4 ANNEX F.3.10 ANNEX G.5.3.3 ANNEX G.5.3.3.3 ANNEX G.5.4.6.3 ANNEX G.7.3.2 ANNEX G.10.2 ANNEX G.13.6 ANNEX G.14 ANNEX G.16 ANNEX P.2.3.2 ANNEX Q.1 ANNEX T.2 (5.4.2.6, 5.4.3.2, G.15.3.6) ANNEX T.3 (4.4.4.2, 4.4.4.5, 5.3.2.3, G.15.3.6, U.3) ANNEX T.4 (4.4.4.2) ANNEX T.4 (4.4.4.2) ANNEX T.6 (4.4.4.4, 8.10.4) ANNEX T.7 (4.4.4.3) ANNEX T.8 (4.4.4.1, 4.4.4.7, 4.8.4.2, 8.6.1, 8.7.2, 8.10.6, G.7.3.2.4) 4.4.4.2, (T.4), (T.5) 4.4.4.3, T.7 4.4.4.4, T.6 4.4.4.5, T.3 4.4.4.7, T.8 4.7 5.2.2.2 5.4.1.4, 6.3.2, 9 5.4.1.5.2 5.4.1.8 5.4.1.10.3 5.4.2, 5.4.3 5.4.2.6, T.2 5.4.8 5.4.9.1 5.5.2.2 5.5.8 6.2.2 6.6 B.2.5 B.3, B.4 G.5.3.3 G.13.6 G.14 Q.1 P.2.3.2
2019-09-05
OFFIEC 60950-1:2005/AMD2:2013
1.2.2.1 1.6.2 1.6.2 1.7.11 2.1.1.5, 2.1.2, 1.2.8.10 2.1.1.7 2.2.2, 2.2.3, 2.2.4, PART 22 6.1 2.4.1, 2.4.2 2.5 2.6.3.4 2.6.3.4, 2.6.1 2.6.3.4, 2.6.1 2.6.4.1, 3.3.1 2.7 2.9.1, 2.9.2, 5.2.2 2.10.2 2.10.2 2.10.5.8, ANNEX AA 2.10.5.9, 2.10.5.10, 2.10.5.6 2.10.5.13 2.10.8, 2.10.9 2.10.10, 2.10.9 2.10.11, 2.10.9 3.2.6, 4.2.1, 4.2.7 4.1 4.2.1 - 4.2.4 4.2.5, 4.2.1, PART 22 10.2 4.2.6, 4.2.1 4.2.7, 4.2.1 4.2.10 4.2.11.1 4.3.1 4.3.2 4.3.5 4.3.6 4.4.2, 4.4.4 4.5.1, 1.4.12, 1.4.13 4.5.5, 4.5 4.6.5 5.1, ANNEX D 5.1, ANNEX D 5.1, ANNEX D 5.2.2 5.3.1, 5.3.4, 5.3.7 5.3.1, 5.3.9 5.3.3, 5.3.7b, ANNEX C.1 5.3.7 5.3.7 ANNEX B.7 4.7 4.7 4.7 4.7 4.7 4.7 5.2, 5.7 5.2.1.1 5.4.1.4, Annex B.2 5.4.1.5.2 5.4.1.8 5.4.1.10.3 5.4.2.4 5.4.4.6.2 5.4.7, 5.4.1.5.3 (5.4.4.4, 5.4.4.5) 5.4.8 5.4.9 5.5.2.2 5.5.8 5.6.6.2(a), 5.6.6.2(b), 5.6.6.4.2(c), 5.6.6.4.2(d), 5.6.6.2(e) 5.7 5.7.5 6.2.2.2, 6.2.2.3 6.2.3.1 6.2.3.2 6.3 6.4.3, ANNEX B.4 6.4.3.3 6.6 8.5.3, ANNEX T.8, ANNEX V 8.8 ANNEX B.2.5 ANNEX B.2.5 ANNEX B.2.6 ANNEX B.3 ANNEX B.4 6.4.2, ANNEX B.4 ANNEX F.3.10 ANNEX G.5.3.3 ANNEX G.5.3.3.3 ANNEX G.5.4.6.3 ANNEX G.7.3.2 ANNEX G.10.2 ANNEX G.13.6 ANNEX G.14 ANNEX G.16 ANNEX P.2.3.2 ANNEX Q.1 ANNEX T.2 (5.4.2.6, 5.4.3.2, G.15.3.6) ANNEX T.3 (4.4.4.2, 4.4.4.5, 5.3.2.3, G.15.3.6, U.3) ANNEX T.4 (4.4.4.2) ANNEX T.4 (4.4.4.2) ANNEX T.6 (4.4.4.4, 8.10.4) ANNEX T.7 (4.4.4.3) ANNEX T.8 (4.4.4.1, 4.4.4.7, 4.8.4.2, 8.6.1, 8.7.2, 8.10.6, G.7.3.2.4) 4.4.4.2, (T.4), (T.5) 4.4.4.3, T.7 4.4.4.4, T.6 4.4.4.5, T.3 4.4.4.7, T.8 4.7 5.2.2.2 5.4.1.4, 6.3.2, 9 5.4.1.5.2 5.4.1.8 5.4.1.10.3 5.4.2, 5.4.3 5.4.2.6, T.2 5.4.8 5.4.9.1 5.5.2.2 5.5.8 6.2.2 6.6 B.2.5 B.3, B.4 G.5.3.3 G.13.6 G.14 Q.1 P.2.3.2
2019-09-05
OFFIEC 62040-1:2008
4.6, 1.6.1/RD, 1.6.2/RD, 1.6.4/RD POWER INTERFACES 5.1.1, 2.1.7/RD CAPACITANCE DISCHARGE TEST 5.2.1, 2.2/RD SAFETY EXTRA LOW VOLTAGE CIRCUITS – SELV 5.2.3 LIMITED CURRENT CIRCUITS 5.1.4, ANNEX I BACKFEED PROTECTION 5.2.5, 2.5/RD LIMITED POWER SOURCE 5.3, 2.6.4/RD EARTHING TEST II 5.7 DETERMINATION OF WORKING VOLTAGE - WORKING VOLTAGE MEASUREMENT TEST 7.2, 4.1/RD Stability Tests 7.4, 4.5.5/RD Ball pressure test 7.7, 4.5/RD TEMPERATURE RISE 8.1, 5.1.1/RD GENERAL PROVISIONS FOR EARTH LEAKAGE 8.2, 5.2/RD ELECTRIC STRENGTH 8.3.2 COMPONENT SHORT AND OPEN CIRCUIT 8.3.2 TRANSFORMER ABNORMAL OPERATION 8.3 ABNORMAL OPERATING AND FAULT CONDITION 8.3.3 CONDITIONS FOR TESTS, FORESEEABLE MISUSE - OUTPUT OVERLOAD ABNORMAL TEST
2019-08-01
OFFIEC 62040-1:2008/AMD1:2013
4.6, 1.6.1/RD, 1.6.2/RD, 1.6.4/RD POWER INTERFACES 5.1.1, 2.1.7/RD CAPACITANCE DISCHARGE TEST 5.2.1, 2.2/RD SAFETY EXTRA LOW VOLTAGE CIRCUITS – SELV 5.2.3 LIMITED CURRENT CIRCUITS 5.1.4, ANNEX I BACKFEED PROTECTION 5.2.5, 2.5/RD LIMITED POWER SOURCE 5.3, 2.6.4/RD EARTHING TEST II 5.7 DETERMINATION OF WORKING VOLTAGE - WORKING VOLTAGE MEASUREMENT TEST 7.2, 4.1/RD Stability Tests 7.4, 4.5.5/RD Ball pressure test 7.7, 4.5/RD TEMPERATURE RISE 8.1, 5.1.1/RD GENERAL PROVISIONS FOR EARTH LEAKAGE 8.2, 5.2/RD ELECTRIC STRENGTH 8.3.2 COMPONENT SHORT AND OPEN CIRCUIT 8.3.2 TRANSFORMER ABNORMAL OPERATION 8.3 ABNORMAL OPERATING AND FAULT CONDITION 8.3.3 CONDITIONS FOR TESTS, FORESEEABLE MISUSE - OUTPUT OVERLOAD ABNORMAL TEST
2019-08-01
TRONIEC 60065:2014
4.2 4.3 4.3.2, 4.3.3, 4.3.5 4.3.10 4.3.11 11 11.1 5 7 8.8 9.1.1 9.1.6 9.1.7 10.2 10.3 10.4 12.1.3 12.1.4 12.1.4 IEC 60065, 12.1.4 IEC 60065, 12.1.4 12.1.5 12.1.5 12.1.6 12.1.7 13.2 15.4.1 15.4.3a 15.4.3b 15.4.3c 16.5 16.5 17.1
2019-09-05
TRONIEC 60065:2001
4.2 4.3 4.3.1, 4.3.2, 4.3.4 4.3.9 4.3.10 11 11.1 5 7 8.8 9.1.1 9.1.6 9.1.7 10.1 10.2 10.3 12.1.2 12.1.3 12.1.3 IEC 60065, 12.1.3 IEC 60065, 12.1.3 12.1.4 12.1.4 12.1.5 12.1.6 13.2 15.4.1 15.4.3a 15.4.3b 15.4.3c 16.5 16.5 17.1
2019-09-05
TRONIEC 60065:2001/AMD1:2005
4.2 4.3 4.3.1, 4.3.2, 4.3.4 4.3.9 4.3.10 11 11.1 5 7 8.8 9.1.1 9.1.6 9.1.7 10.1 10.2 10.3 12.1.2 12.1.3 12.1.3 IEC 60065, 12.1.3 IEC 60065, 12.1.3 12.1.4 12.1.4 12.1.5 12.1.6 13.2 15.4.1 15.4.3a 15.4.3b 15.4.3c 16.5 16.5 17.1
2019-09-05
TRONIEC 60065:2001/AMD2:2010
4.2 4.3 4.3.1, 4.3.2, 4.3.4 4.3.9 4.3.10 11 11.1 5 7 8.8 9.1.1 9.1.6 9.1.7 10.1 10.2 10.3 12.1.2 12.1.3 12.1.3 IEC 60065, 12.1.3 IEC 60065, 12.1.3 12.1.4 12.1.4 12.1.5 12.1.6 13.2 15.4.1 15.4.3a 15.4.3b 15.4.3c 16.5 16.5 17.1
2019-09-05
IEC 62368-1:2014
4.7 5.2, 5.7 5.2.1.1 5.4.1.4, Annex B.2 5.4.1.5.2 5.4.1.8 5.4.1.10.3 5.4.2.4 5.4.4.6.2 5.4.7, 5.4.1.5.3 (5.4.4.4, 5.4.4.5) 5.4.8 5.4.9 5.5.2.2 5.5.8 5.6.6.2(a), 5.6.6.2(b), 5.6.6.4.2(c), 5.6.6.4.2(d), 5.6.6.2(e) 5.7 5.7.5 6.2.2.2, 6.2.2.3 6.2.3.1 6.2.3.2 6.3 6.4.3,
2019-09-05