IEC 60747-5-3:1997

 
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IEC 60747-5-3:1997

Title
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
Abstract
Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.
Issue date
1997-09-05
Category
MISC
Included in IECEE System
2007-10-01
Test Report Form
Testing Equipment List